Leeb Hardness Tester NOVOTEST T-D3

Description

Dynamic (Leeb) probe is used for measuring the hardness of non-ferrous metals, cast iron, coarse-grained materials, massive products etc. Built-in camera allows user to take a picture of tested object and mark tested area with corresponding hardness value. Hardness Testers NOVOTEST T-D3 has sealed housing with rubber protective bumper, it is ideal for use in workshop and field conditions with high humidity, dust, etc. Hardness tester has frost-resistant display that allows user to use the device at any seasons and in any climatic zones of the Earth.

Leeb method for the hardness testing

Leeb probe is used for measuring the hardness of non-ferrous metals, cast iron, coarse-grained materials, massive products etc. Hardness tester T-D3 also use a dynamic method of the hardness measuring – Leeb method, which is standardized according to ASTM A956. This method allows user to measure very fast and easy: install the probe, press on the probe to recharge spring, press the button on the top of the probe to make test and after that save the results of the hardness value, which are showed on the display of the device. This method is used for measuring the hardness value of non-ferrous metals, cast iron, coarse-grained materials, massive products etc. (with weigh more than 5 kg or thicker than 10 mm) also this method perfectly complements the UCI method of hardness measuring. Hardness tester T-UD3 makes automatic calculation of the hardness of a wide range of materials – steel, stainless steel, cast iron, bronze, aluminum, so that we can say that combined hardness testers is the most universal, which is needn’t in recalibration, and fully ready for operation after “getting out of the box”.

Leeb Hardness Tester NOVOTEST T-D3 has different operating modes:

  • Graph – the mode of building of graph;
  • Histogram – the mode of building of histogram;
  • Statistics – the mode of statistic;
  • Smart – the mode of filtering of incorrect measurements;
  • Signal – the mode of displaying of signal.

Features

Leeb probe types
  • D
  • DC
  • DL
  • C
  • D+15
  • E
  • G
Measuring range for steel
  • HRC:20~70
  • HB:90~650
  • HV:230~940
  • Tensile strength, MPa: 370~1740
  • User calibrations for any range (for example: HV100-1600)
Measuring accuracy
  • HRC: 2HRC
  • HB: 10HB
  • HV: 15HV
Standards
  • ASTM A956
  • ASTM E140
IndenterHardened ball (Leeb)
Measuring directionAny direction 360°
Data storageLimited only by the memory card up to 32Gb
CommunicationUpload data to PC and export as a spreadsheet (USB cable and software included )
Hardness scale
  • Leeb probe – HRC, HRB, HB, HV, HL, MPa
  • Additional custom scales for calibration
Materials
  • Dynamic (Leeb) pre-calibrated for steel, alloy steel, cast iron, stainless steel, aluminum, bronze, brass, copper
  • Additional custom materials for calibration
Data display
  • Angle (Leeb)
  • Single test result
  • Max, Min, Average of tests
  • Number of tests
  • Deviation
  • Var. coeff.
  • Histogram
  • Signal and Smart Mode (Filter of incorrect measurements)
IndicationColor LCD display (320×240)
Operating environment
  • Temperature:-20°C~40°C
  • Humidity: 30%~80%R.H.
Power supplyDC 4,5V (3 pcs batteries AA)
Instrument dimensions160x75x30mm
Net weightApprox. 0.3kg (Without probe)
Battery lifeApprox. 10 hours.

Standard Packages

  • Hardness tester
  • Leeb probe (D type)
  • 3pcs AA batteries
  • Charger
  • USB cable
  • Operating manual
  • Software for PC
  • Calibration certificate
  • Case

Available Option

  • Additional probes of various types of Leeb probes (D, DC, DL, C, D+15, E, G). Also, after the purchase if will be needed, user can order the additional ultrasonic (UCI) probe U1 with activation code and will get combined hardness tester with two probes (Leeb+UCI)
  • Different colors of rubber bumper protected case
  • Wireless printer
  • Batteries
  • Chargers
  • Hardness tests blocks
  • Portable grinding machine
  • Case for hardness tester
  • Set of support rings for D, DC type Leeb probes
  • Impact bodies for Leeb probes

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